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dc.contributor.authorSandnes, Frode Eika
dc.date.accessioned2020-12-11T09:29:25Z
dc.date.accessioned2021-02-16T09:09:20Z
dc.date.available2020-12-11T09:29:25Z
dc.date.available2021-02-16T09:09:20Z
dc.date.issued2020-05-18
dc.identifier.citationSandnes FE. Frode Eika Sandnes, A simple back-of-the-envelope test for self-citations using Google Scholar author profiles. Scientometrics. 2020;124(2):1685-1689en
dc.identifier.issn1588-2861
dc.identifier.issn0138-9130
dc.identifier.issn1588-2861
dc.identifier.urihttps://hdl.handle.net/10642/9564
dc.description.abstractThe issue of self-citation has received much attention in academia. Widely used and accessible tools such as Google Scholar do not provide information about self-citations. Therefore, a simple and practical back-of-the-envelope test for identifying researchers with strategic self-citations is proposed without access to self-citation information. It is shown that the h-index squared divided by the number of citations predicts self-citations. The test is simple to apply based on Google Scholar author profiles. Bibliometric data for more than 100,000 researchers worldwide were used to assess the proposed test. Test values of 0.35 or more indicate high ratios of self-citation while test values below 0.2 suggest low ratios of self-citations.en
dc.language.isoenen
dc.publisherSpringeren
dc.relation.ispartofseriesScientometrics;124 (2020)
dc.rightsThis is a post-peer-review, pre-copyedit version of an article published in Scientometrics. The final authenticated version is available online at: https://doi.org/10.1007/s11192-020-03521-6en
dc.subjectSelf-citationsen
dc.subjectTestsen
dc.subjectResearchersen
dc.subjectH-indexesen
dc.subjectPublication metricsen
dc.titleA simple back-of-the-envelope test for self-citations using Google Scholar author profilesen
dc.typeJournal articleen
dc.typePeer revieweden
dc.date.updated2020-12-11T09:29:25Z
dc.description.versionacceptedVersionen
dc.identifier.doihttps://doi.org/10.1007/s11192-020-03521-6
dc.identifier.cristin1858633
dc.source.journalScientometrics


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